ASAP Semiconductor is an industry-leading distributor for shopping for parts by National Stock Number (NSN) data, the items featured within this catalog all falling under NSN 6625-00-179-5844 (6625001795844). Toward the top of this page, you will find several details that pertain to this NSN, allowing you to confirm various aspects of these offerings to ensure accurate procurement. Meanwhile, the part numbers that we have available for purchase can be found below, with Request for Quote (RFQ) links provided alongside each should you wish to make a purchase. Our team is also available by phone or email to support you during the procurement process, so never hesitate to take the first step with us.
| Alternative NSN: | 6625001795844 |
| Manufacturers | Hickok Incorporated , Joint Electronics Type Designation System |
| Item Name | Test Set Semiconduc |
| INC Code | 25006 |
| Federal Supply Group (FSG) | 66 Instruments and Laboratory Equipment |
| Federal Supply Class (FSC) | 6625 Electrical And Electronic Properties Measuring And Testing Instruments |
| National Item Identification Number (NIIN) | 00-179-5844 (001795844) |
| NCB Code | USA (00) |
| Part No | Manufacturer | Item Name | CAGE Code | Type | Status | Availability | RFQ | |
|---|---|---|---|---|---|---|---|---|
| 902-470 | joint electronics type designation system | test set semiconduc | 80058 | NA | NA | Avl | RFQ |
|
| 902-470 | hickok incorporated | test set semiconduc | 28569 | a | a | Avl | RFQ |
|
| ANUSM206A | joint electronics type designation system | test set semiconduc | 80058 | NA | NA | Avl | RFQ |
|
| ANUSM206A | hickok incorporated | test set semiconduc | 28569 | a | a | Avl | RFQ |
|
| MRC | Criteria | Characteristic |
|---|---|---|
| AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
| ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
| FAAZ | PHASE | SINGLE |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
| AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
| ABRY | LENGTH | 9.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
| AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
| AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
| AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
| AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| HGTH | HEIGHT | 10.000 INCHES NOMINAL |
| AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
| ABGL | WIDTH | 8.000 INCHES NOMINAL |
| 6685-00-453-7109 (6685004537109) | 6685-01-252-3569 (6685012523569) | 6685-00-113-6576 (6685001136576) | 6650-01-255-2390 (6650012552390) |
| 6650-01-096-4993 (6650010964993) | 6625-01-445-2930 (6625014452930) | 6625-01-483-5099 (6625014835099) | 6645-00-225-2713 (6645002252713) |
| 6625-01-436-7103 (6625014367103) | 6625-00-135-7365 (6625001357365) | 6680-01-450-5074 (6680014505074) | 6625-01-073-2255 (6625010732255) |
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