ASAP Semiconductor is an industry-leading distributor for shopping for parts by National Stock Number (NSN) data, the items featured within this catalog all falling under NSN 6625-01-287-3379 (6625012873379). Toward the top of this page, you will find several details that pertain to this NSN, allowing you to confirm various aspects of these offerings to ensure accurate procurement. Meanwhile, the part numbers that we have available for purchase can be found below, with Request for Quote (RFQ) links provided alongside each should you wish to make a purchase. Our team is also available by phone or email to support you during the procurement process, so never hesitate to take the first step with us.
Alternative NSN: | 6625012873379 |
Manufacturers | Accelonix , Huntron Inc |
Item Name | Test Set Electronic |
INC Code | 77777 |
Federal Supply Group (FSG) | 66 Instruments and Laboratory Equipment |
Federal Supply Class (FSC) | 6625 Electrical And Electronic Properties Measuring And Testing Instruments |
National Item Identification Number (NIIN) | 01-287-3379 (012873379) |
NCB Code | USA (01) |
Part No | Manufacturer | Item Name | CAGE Code | Type | Status | Availability | RFQ | |
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99-0075 | huntron inc | test set electronic | 57705 | a | a | Avl | RFQ |
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99-0075 | accelonix | test set electronic | f8791 | e | a | Avl | RFQ |
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99-0076 | accelonix | test set electronic | f8791 | e | a | Avl | RFQ |
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99-0076 | huntron inc | test set electronic | 57705 | a | a | Avl | RFQ |
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MODEL-2000 | huntron inc | test set electronic | 57705 | a | a | Avl | RFQ |
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MODEL-2000 | accelonix | test set electronic | f8791 | e | a | Avl | RFQ |
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TRACKER-2000 | huntron inc | test set electronic | 57705 | a | a | Avl | RFQ |
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TRACKER-2000 | accelonix | test set electronic | f8791 | e | a | Avl | RFQ |
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MRC | Criteria | Characteristic |
---|---|---|
TEXT | GENERAL CHARACTERISTICS ITEM DESCRIPTION | FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT |
ZZZW | DEPARTURE FROM CITED DOCUMENT | PEACETIME DEMAND OBTAIN |
CXCY | III PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER |
6685-00-453-7109 (6685004537109) | 6685-01-252-3569 (6685012523569) | 6685-00-113-6576 (6685001136576) | 6650-01-255-2390 (6650012552390) |
6650-01-096-4993 (6650010964993) | 6625-01-445-2930 (6625014452930) | 6625-01-483-5099 (6625014835099) | 6645-00-225-2713 (6645002252713) |
6625-01-436-7103 (6625014367103) | 6625-00-135-7365 (6625001357365) | 6680-01-450-5074 (6680014505074) | 6625-01-073-2255 (6625010732255) |
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