Part Number : 50B3 | Manufacturer : Bogue Systems Inc | ||
NSN : 5961-00-926-0250 (5961009260250) | |||
Item Name : Semiconductor Device Diode | CAGE Code : 0BXF1 | ||
NIIN : 00-926-0250 (009260250) | |||
FSC Code : 5961 Semiconductor Devices and Associated Hardware | |||
FSG Code : 59 Electrical and Electronic Equipment Components | |||
INC Code : 20589 | |||
NCB Code : 00 | Country : USA |
Thank you for taking an interest in part number 50B3, that of which is listed with the description Semiconductor Device Diode; Manufactured by Bogue Systems Inc and listed alongside the NSN 5961009260250, part number 50B3 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : 50B3 | Manufacturer : Bogue Systems Inc | ||
NSN Number : 5961-00-926-0250 (5961009260250) | |||
Item Name : Semiconductor Device Diode | CAGE Code : 0BXF1 | ||
NIIN : 009260250 | |||
FSC CODE : 5961 Semiconductor Devices and Associated Hardware |
Thank you for taking an interest in part number 50B3, that of which is listed with the description Semiconductor Device Diode; Manufactured by Bogue Systems Inc and listed alongside the NSN 5961009260250, part number 50B3 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-926-0250 Item PartTypeName: SEMICONDUCTOR DEVICE,DIODE | 5961 | 009260250 | N | A | ||
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
A | U | |||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
50B3 | 1 | 2 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABHP | OVERALL LENGTH | 0.405 INCHES MAXIMUM |
ADAV | OVERALL DIAMETER | 0.424 INCHES MAXIMUM |
AKPV | MOUNTING FACILITY QUANTITY | 1 |
ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-4 |
AXGY | MOUNTING METHOD | THREADED STUD |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM |
CQJX | NOMINAL THREAD SIZE | 0.190 INCHES |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 500.0 MAXIMUM REVERSE VOLTAGE,PEAK |
CTQX | CURRENT RATING PER CHARACTERISTIC | 1.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS CASE |
MATT | MATERIAL | GLASS INCLOSURE |
MATT | MATERIAL | SILICON SEMICONDUCTOR |
THSD | THREAD SERIES DESIGNATOR | UNF |
TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 1 TAB,SOLDER LUG |
ZZZK | SPECIFICATION/STANDARD DATA | 80131-RELEASE2165 PROFESSIONAL/INDUSTRIAL ASSOCIATION SPECIFICATION |
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