| Part Number : 5962-8552604LA | Manufacturer : Dla Land And Maritime | ||
| NSN : 5962-01-369-8529 (5962013698529) | |||
| Item Name : Microcircuit Memory | CAGE Code : 16236 | ||
| NIIN : 01-369-8529 (013698529) | |||
| FSC Code : 5962 Microcircuits Electronic | |||
| FSG Code : 59 Electrical and Electronic Equipment Components | |||
| INC Code : 41015 | |||
| NCB Code : 01 | Country : USA | ||
| Alternate P/N: 59628552604LA | |||
Thank you for taking an interest in part number 5962-8552604LA, that of which is listed with the description Microcircuit Memory; Manufactured by Dla Land And Maritime and listed alongside the NSN 5962013698529, part number 5962-8552604LA is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 5962-8552604LA | Manufacturer : Dla Land And Maritime | ||
| NSN Number : 5962-01-369-8529 (5962013698529) | |||
| Item Name : Microcircuit Memory | CAGE Code : 16236 | ||
| NIIN : 013698529 | |||
| FSC CODE : 5962 Microcircuits Electronic | |||
Thank you for taking an interest in part number 5962-8552604LA, that of which is listed with the description Microcircuit Memory; Manufactured by Dla Land And Maritime and listed alongside the NSN 5962013698529, part number 5962-8552604LA is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-369-8529 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013698529 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 5962-8552604LA | 5 | 1 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.02 WATTS |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| AGAV | END ITEM IDENTIFICATION | AN/FPS-124 |
| CBBL | FEATURES PROVIDED | PROGRAMMED |
| CQWX | OUTPUT LOGIC FORM | BIPOLAR METAL-OXIDE SEMICONDUCTOR |
| CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-9 MIL-M-38510 |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,DIGITAL,SCHOTTKY,BIPOLAR 16,384 BIT(2KX8) PROGRAMMABLE READ-ONLY MEMORY(PROM),MONOLITHIC SILICON |
| CZEQ | TIME RATING PER CHACTERISTIC | 65.00 NANOSECONDS NOMINAL ACCESS |
| CZER | MEMORY DEVICE TYPE | PROM |
| TEST | TEST DATA DOCUMENT | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| ZZZT | NONDEFINITIVE SPEC/STD DATA | 202 NUMBER |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CZES | HYBRID TECHNOLOGY TYPE | MONOLITHIC |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| ZZZK | SPECIFICATION/STANDARD DATA | 56232-1212248 MANUFACTURERS SPECIFICATION CONTROL |
| CTQX | CURRENT RATING PER CHARACTERISTIC | -30.00 MILLIAMPERES MINIMUM ABSOLUTE OUTPUT AND 5.00 MILLIAMPERES MAXIMUM ABSOLUTE OUTPUT |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY AND 4.5 VOLTS MINIMUM POSITIVE POWER SUPPLY SPAN AND 5.5 VOLTS MAXIMUM POSITIVE POWER SUPPLY SPAN |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| ZZZW | DEPARTURE FROM CITED DOCUMENT | ALTERED BY PROGRAMMING,MARKING & TESTING |
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