| Part Number : 390A3 | Manufacturer : Edo Corporation | ||
| NSN : 6625-00-504-1949 (6625005041949) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 00752 | ||
| NIIN : 00-504-1949 (005041949) | |||
| FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
| FSG Code : 66 Instruments and Laboratory Equipment | |||
| INC Code : 25006 | |||
| NCB Code : 00 | Country : USA | ||
Thank you for taking an interest in part number 390A3, that of which is listed with the description Test Set Semiconduc; Manufactured by Edo Corporation and listed alongside the NSN 6625005041949, part number 390A3 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 390A3 | Manufacturer : Edo Corporation | ||
| NSN Number : 6625-00-504-1949 (6625005041949) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 00752 | ||
| NIIN : 005041949 | |||
| FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
Thank you for taking an interest in part number 390A3, that of which is listed with the description Test Set Semiconduc; Manufactured by Edo Corporation and listed alongside the NSN 6625005041949, part number 390A3 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| MRC | Criteria | Characteristic |
|---|---|---|
| HGTH | HEIGHT | 3.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 1.5 VOLTS NOMINAL |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TO MEASURE THE RELATIVE NOISE FIGURE OF MICROWAVE MIXER CRYSTALS,TO OBTAIN AN APPROXIMATE IMPEDANCE CHECK FOR SELECTING MATCHED CRYSTALS,FOR USE IN BALANCE MIXERS,TO MEASURE THE RELATIVE SENSITIVITY OF MICROWAVE DETECTOR CRYSTALS |
| ABGL | WIDTH | 6.000 INCHES NOMINAL |
| ABRY | LENGTH | 6.000 INCHES NOMINAL |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| FEAT | SPECIAL FEATURES | ACCEPTS CERAMIC CARTRIDGE AND COAXIAL TYPES OF BOTH NORMAL AND REVERSED POLARITIES; REMOTE TEST JACK PERMITS TESTING CRYSTALS W/O REMOVING THEM FROM RECEIVER |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| AQXZ | OPERATING TEST CAPABILITY | SILICON MIXER CRYSTALS,RANGE 0 TO 10000 MC,PORM 1/2 DB ON CONVERSION LOSS,PORM 0.5 DB ON NOISE TEMP |
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