| Part Number : 15-1326286-1 | Manufacturer : Gte Corp | ||
| NSN : 5962-01-375-7492 (5962013757492) | |||
| Item Name : Microcircuit Memory | CAGE Code : 0BDC6 | ||
| NIIN : 01-375-7492 (013757492) | |||
| FSC Code : 5962 Microcircuits Electronic | |||
| FSG Code : 59 Electrical and Electronic Equipment Components | |||
| INC Code : 41015 | |||
| NCB Code : 01 | Country : USA | ||
| Alternate P/N: 1513262861 | |||
Thank you for taking an interest in part number 15-1326286-1, that of which is listed with the description Microcircuit Memory; Manufactured by Gte Corp and listed alongside the NSN 5962013757492, part number 15-1326286-1 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 15-1326286-1 | Manufacturer : Gte Corp | ||
| NSN Number : 5962-01-375-7492 (5962013757492) | |||
| Item Name : Microcircuit Memory | CAGE Code : 0BDC6 | ||
| NIIN : 013757492 | |||
| FSC CODE : 5962 Microcircuits Electronic | |||
Thank you for taking an interest in part number 15-1326286-1, that of which is listed with the description Microcircuit Memory; Manufactured by Gte Corp and listed alongside the NSN 5962013757492, part number 15-1326286-1 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-375-7492 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013757492 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 15-1326286-1 | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AGAV | End Item Identification | HAC/RMPE REACT BASIC |
| NHCF | Nuclear Hardness Critical Feature | HARDENED |
| CZZZ | Memory Capacity | 128K X 8 |
| CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
| CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| CZER | Memory Device Type | EPROM |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
| ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
| CQSJ | Inclosure Material | CERAMIC |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| MRC | Decoded Requirement | Clear Text Reply |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| CWSG | Terminal Surface Treatment | SOLDER |
| CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | Criticality Code Justification | FEAT |
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