Part Number : 1N5597-1 4 STUD | Manufacturer : Joint Electron Device Engineering | ||
NSN : 5961-00-011-9482 (5961000119482) | |||
Item Name : Semiconductor Device Diode | CAGE Code : 07688 | ||
NIIN : 00-011-9482 (000119482) | |||
FSC Code : 5961 Semiconductor Devices and Associated Hardware | |||
FSG Code : 59 Electrical and Electronic Equipment Components | |||
INC Code : 20589 | |||
NCB Code : 00 | Country : USA | ||
Alternate P/N: 1N559714STUD |
Thank you for taking an interest in part number 1N5597-1 4 STUD, that of which is listed with the description Semiconductor Device Diode; Manufactured by Joint Electron Device Engineering and listed alongside the NSN 5961000119482, part number 1N5597-1 4 STUD is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : 1N5597-1 4 STUD | Manufacturer : Joint Electron Device Engineering | ||
NSN Number : 5961-00-011-9482 (5961000119482) | |||
Item Name : Semiconductor Device Diode | CAGE Code : 07688 | ||
NIIN : 000119482 | |||
FSC CODE : 5961 Semiconductor Devices and Associated Hardware |
Thank you for taking an interest in part number 1N5597-1 4 STUD, that of which is listed with the description Semiconductor Device Diode; Manufactured by Joint Electron Device Engineering and listed alongside the NSN 5961000119482, part number 1N5597-1 4 STUD is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-011-9482 Item PartTypeName: SEMICONDUCTOR DEVICE,DIODE | 5961 | 000119482 | 0 | N | A | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | A | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
1N5597 | 3 | 1 | C | A |
MRC | Criteria | Characteristic |
---|---|---|
ABHP | OVERALL LENGTH | 0.347 INCHES MAXIMUM |
ADAV | OVERALL DIAMETER | 1.950 INCHES MAXIMUM |
AXGY | MOUNTING METHOD | THREADED STUD AND THREADED HOLE |
CQJX | NOMINAL THREAD SIZE | 0.250 INCHES |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 10000.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION |
MATT | MATERIAL | SILICON SEMICONDUCTOR |
TEST | TEST DATA DOCUMENT | 037Z3-03021 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWIN |
THSD | THREAD SERIES DESIGNATOR | UNF |
TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED HOLE AND 1 THREADED STUD |
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