| Part Number : TS1836CU | Manufacturer : Joint Electronics Type Designation System | ||
| NSN : 6625-00-159-2263 (6625001592263) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
| NIIN : 00-159-2263 (001592263) | |||
| FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
| FSG Code : 66 Instruments and Laboratory Equipment | |||
| INC Code : 25006 | |||
| NCB Code : 00 | Country : USA | ||
Thank you for taking an interest in part number TS1836CU, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625001592263, part number TS1836CU is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : TS1836CU | Manufacturer : Joint Electronics Type Designation System | ||
| NSN Number : 6625-00-159-2263 (6625001592263) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
| NIIN : 001592263 | |||
| FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
Thank you for taking an interest in part number TS1836CU, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625001592263, part number TS1836CU is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| MRC | Criteria | Characteristic |
|---|---|---|
| AFHS | ACCESSORY COMPONENT QUANTITY | 3 |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA;ELECTRODE RESISTANCE AND CURRENT;FIELD EFFECT TRANSISTOR,DIODE AND RECTIFIER |
| ABGL | WIDTH | 7.000 INCHES NOMINAL |
| HGTH | HEIGHT | 8.500 INCHES NOMINAL |
| ACYR | DC VOLTAGE RATING | 9.0 VOLTS NOMINAL |
| AEAS | MAJOR COMPONENTS | TEST LEADS |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET,TRANSISTOR |
| ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
| AQXZ | OPERATING TEST CAPABILITY | BETA TEST RANGE 1 TO 100 PORM 5 PCT OUT OF CIRCUIT,10 TO 1000 PORM 5 PCT IN CIRCUIT,1 TO 100 PORM 10 PCT 500 OHM LOAD EMITTER TO BASE,10 TO 1000 PORM 10 PCT 500 OHM LOAD EMITTER TO BASE;ELECTRODE RESISTANCE RANGE 0 TO 5000 PORM 5 PCT EMITTER TO BASE,0 TO 5000 PORM 5 PCT COLLECTOR TO BASE,0 TO 5000 PORM 5 PCT COLLECTOR TO EMMITTER;ELECTRODE CURRENT RANGE 0 TO 100 UA PORM 3 PCT FULL SCALE COLLECTOR CUT OFF EMITTER OPEN,0 TO 1 MA PORM 3 PCT FULL SCALE;COLLECTOR CUT OFF EMITTER OPEN;FIELDEFFECT TRANSISTOR GAIN MAX OR MIN RANGE 0 TO 2500 MICROMHOSPORM 5 PCT OUT OFCIRCUIT,0 TO 2500 MICROMHOS PORM 10 PCT IN CIRCUIT;GATE SOURCE LOAD 100 OHMS;DRAIN SOURCE LOAD 4000 OHM;DIODE CURRENT RANGE 0 TO 100 UA PORM 3 PCT FULL SCALE,0 TO 1 MA PORM 3 PCT FULL SCALE;DIODE REVERSE TO FORWARD RATIO 1,10 PORM 5 PCT |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| ABRY | LENGTH | 6.500 INCHES NOMINAL |
| AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TS-1836C/U |
| AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
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