| Part Number : 902-470 | Manufacturer : Joint Electronics Type Designation System | ||
| NSN : 6625-00-179-5844 (6625001795844) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
| NIIN : 00-179-5844 (001795844) | |||
| FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
| FSG Code : 66 Instruments and Laboratory Equipment | |||
| INC Code : 25006 | |||
| NCB Code : 00 | Country : USA | ||
| Alternate P/N: 902470 | |||
Thank you for taking an interest in part number 902-470, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625001795844, part number 902-470 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 902-470 | Manufacturer : Joint Electronics Type Designation System | ||
| NSN Number : 6625-00-179-5844 (6625001795844) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
| NIIN : 001795844 | |||
| FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
Thank you for taking an interest in part number 902-470, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625001795844, part number 902-470 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| MRC | Criteria | Characteristic |
|---|---|---|
| AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
| ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
| FAAZ | PHASE | SINGLE |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
| AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
| ABRY | LENGTH | 9.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
| AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
| AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
| AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
| AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| HGTH | HEIGHT | 10.000 INCHES NOMINAL |
| AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
| ABGL | WIDTH | 8.000 INCHES NOMINAL |
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