| Part Number : ANUSM206A | Manufacturer : Joint Electronics Type Designation System | ||
| NSN : 6625-00-179-5844 (6625001795844) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
| NIIN : 00-179-5844 (001795844) | |||
| FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
| FSG Code : 66 Instruments and Laboratory Equipment | |||
| INC Code : 25006 | |||
| NCB Code : 00 | Country : USA | ||
Thank you for taking an interest in part number ANUSM206A, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625001795844, part number ANUSM206A is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : ANUSM206A | Manufacturer : Joint Electronics Type Designation System | ||
| NSN Number : 6625-00-179-5844 (6625001795844) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
| NIIN : 001795844 | |||
| FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
Thank you for taking an interest in part number ANUSM206A, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625001795844, part number ANUSM206A is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| MRC | Criteria | Characteristic |
|---|---|---|
| AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
| ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
| FAAZ | PHASE | SINGLE |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
| AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
| ABRY | LENGTH | 9.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
| AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
| AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
| AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
| AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| HGTH | HEIGHT | 10.000 INCHES NOMINAL |
| AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
| ABGL | WIDTH | 8.000 INCHES NOMINAL |
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