Part Number : TS-3253-TPM-39 | Manufacturer : Joint Electronics Type Designation System | ||
NSN : 6625-00-222-1117 (6625002221117) | |||
Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
NIIN : 00-222-1117 (002221117) | |||
FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
FSG Code : 66 Instruments and Laboratory Equipment | |||
INC Code : 25006 | |||
NCB Code : 00 | Country : USA | ||
Alternate P/N: TS3253TPM39 |
Thank you for taking an interest in part number TS-3253-TPM-39, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625002221117, part number TS-3253-TPM-39 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : TS-3253-TPM-39 | Manufacturer : Joint Electronics Type Designation System | ||
NSN Number : 6625-00-222-1117 (6625002221117) | |||
Item Name : Test Set Semiconduc | CAGE Code : 80058 | ||
NIIN : 002221117 | |||
FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments |
Thank you for taking an interest in part number TS-3253-TPM-39, that of which is listed with the description Test Set Semiconduc; Manufactured by Joint Electronics Type Designation System and listed alongside the NSN 6625002221117, part number TS-3253-TPM-39 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
MRC | Criteria | Characteristic |
---|---|---|
ZZZV | Fsc Application Data | TEST SET,ELECT. EQUIP. |
ANNQ | Material And Location | ALUMINUM HOUSING |
MRC | Decoded Requirement | Clear Text Reply |
HGTH | Height | 3.880 INCHES NOMINAL |
AKWA | Joint Electronics Type Designation System Item Name | TEST SET,SEMICONDUCTOR DEVICE |
AKWB | Joint Electronics Type Designation System Item Type Number | TS-3253/TPM-39 |
ANPZ | Inclosure Feature | SINGLE ITEM W/HOUSING |
ABGL | Width | 4.250 INCHES NOMINAL |
AQXY | Test Type For Which Designed | MICROWAVE DIODE CURRENT |
SFTT | Surface Treatment | ENAMEL |
AQXZ | Operating Test Capability | MICROAMPHERE METER RANGE 0-1000 UA DC |
ABRY | Length | 5.500 INCHES NOMINAL |
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