| Part Number : 247503-16 | Manufacturer : Litton Systems Inc | ||
| NSN : 5962-01-374-8582 (5962013748582) | |||
| Item Name : Microcircuit Memory | CAGE Code : 13973 | ||
| NIIN : 01-374-8582 (013748582) | |||
| FSC Code : 5962 Microcircuits Electronic | |||
| FSG Code : 59 Electrical and Electronic Equipment Components | |||
| INC Code : 41015 | |||
| NCB Code : 01 | Country : USA | ||
| Alternate P/N: 24750316 | |||
Thank you for taking an interest in part number 247503-16, that of which is listed with the description Microcircuit Memory; Manufactured by Litton Systems Inc and listed alongside the NSN 5962013748582, part number 247503-16 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 247503-16 | Manufacturer : Litton Systems Inc | ||
| NSN Number : 5962-01-374-8582 (5962013748582) | |||
| Item Name : Microcircuit Memory | CAGE Code : 13973 | ||
| NIIN : 013748582 | |||
| FSC CODE : 5962 Microcircuits Electronic | |||
Thank you for taking an interest in part number 247503-16, that of which is listed with the description Microcircuit Memory; Manufactured by Litton Systems Inc and listed alongside the NSN 5962013748582, part number 247503-16 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-374-8582 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013748582 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 247503-9006 | 2 | 9 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ZZZK | Specification/Standard Data | 67268-8001203JA GOVERNMENT STANDARD |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT DIGITAL,NMOS 4KX8 UV ERASABLE PROM |
| MRC | Decoded Requirement | Clear Text Reply |
| CZES | Hybrid Technology Type | MONOLITHIC |
| CZER | Memory Device Type | EPROM |
| AEHX | Maximum Power Dissipation Rating | 1.0 WATTS |
| CBBL | Features Provided | ELECTROSTATIC SENSITIVE AND MONOLITHIC AND PROGRAMMED AND ULTRAVIOLET ERASABLE AND W/HEAT SINK |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| AFGA | Operating Temp Range | -55.0 TO 125.0 DEG CELSIUS |
| TTQY | Terminal Type And Quantity | 24 PRINTED CIRCUIT |
| AFJQ | Storage Temp Range | -65.0 TO 150.0 DEG CELSIUS |
| ZZZP | Purchase Description Identification | 13973-247503-16 |
| CZEN | Voltage Rating And Type Per Characteristic | -0.3 VOLTS MINIMUM TOTAL SUPPLY AND 6.0 VOLTS MAXIMUM TOTAL SUPPLY |
| CTFT | Case Outline Source And Designator | D-3 MIL-M-38510 |
| AGAV | End Item Identification | AN/TYQ-23(V)1 E/I FSCM 13973 |
| CWSG | Terminal Surface Treatment | SOLDER |
| CZEQ | Time Rating Per Chacteristic | 250.00 NANOSECONDS NOMINAL ACCESS |
| TEST | Test Data Document | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). AND 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CQWX | Output Logic Form | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| ZZZW | Departure From Cited Document | ALTERED BY PROGRAMMING AND MARKING |
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