| Part Number : 338140-075 | Manufacturer : Lockheed Martin Corporation | ||
| NSN : 5961-00-137-4833 (5961001374833) | |||
| Item Name : Semiconductor Device Diode | CAGE Code : 56232 | ||
| NIIN : 00-137-4833 (001374833) | |||
| FSC Code : 5961 Semiconductor Devices and Associated Hardware | |||
| FSG Code : 59 Electrical and Electronic Equipment Components | |||
| INC Code : 20589 | |||
| NCB Code : 00 | Country : USA | ||
| Alternate P/N: 338140075 | |||
Thank you for taking an interest in part number 338140-075, that of which is listed with the description Semiconductor Device Diode; Manufactured by Lockheed Martin Corporation and listed alongside the NSN 5961001374833, part number 338140-075 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 338140-075 | Manufacturer : Lockheed Martin Corporation | ||
| NSN Number : 5961-00-137-4833 (5961001374833) | |||
| Item Name : Semiconductor Device Diode | CAGE Code : 56232 | ||
| NIIN : 001374833 | |||
| FSC CODE : 5961 Semiconductor Devices and Associated Hardware | |||
Thank you for taking an interest in part number 338140-075, that of which is listed with the description Semiconductor Device Diode; Manufactured by Lockheed Martin Corporation and listed alongside the NSN 5961001374833, part number 338140-075 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-00-137-4833 Item PartTypeName: SEMICONDUCTOR DEVICE,DIODE | 5961 | 001374833 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| TX1N3046B | 5 | 1 | C | A |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 0.371 INCHES MAXIMUM |
| ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM |
| ADAV | OVERALL DIAMETER | 0.215 INCHES MINIMUM AND 0.265 INCHES MAXIMUM |
| ALBA | ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | CATHODE |
| AXGY | MOUNTING METHOD | TERMINAL |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 120.0 NOMINAL NOMINAL REGULATOR VOLTAGE |
| CTQS | VOLTAGE TOLERANCE IN PERCENT | -5.0 TO 5.0 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 2.00 MILLIAMPERES NOMINAL VOLTAGE REGULATOR DIODE CURRENT AND 8.00 MILLIAMPERES MAXIMUM MAXIMUM DC CURRENT IN REVERSE BREAKDOWN REGION |
| CTRD | POWER RATING PER CHARACTERISTIC | 1.0 WATTS MAXIMUM TOTAL POWER DISSIPATION |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS AMBIENT AIR |
| MATT | MATERIAL | SILICON SEMICONDUCTOR |
| TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/115 GOVERNMENT SPECIFICATION |
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