| Part Number : 1219253-204 | Manufacturer : Lockheed Martin Corporation | ||
| NSN : 5962-01-370-0389 (5962013700389) | |||
| Item Name : Microcircuit Memory | CAGE Code : 03538 | ||
| NIIN : 01-370-0389 (013700389) | |||
| FSC Code : 5962 Microcircuits Electronic | |||
| FSG Code : 59 Electrical and Electronic Equipment Components | |||
| INC Code : 41015 | |||
| NCB Code : 01 | Country : USA | ||
| Alternate P/N: 1219253204 | |||
Thank you for taking an interest in part number 1219253-204, that of which is listed with the description Microcircuit Memory; Manufactured by Lockheed Martin Corporation and listed alongside the NSN 5962013700389, part number 1219253-204 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : 1219253-204 | Manufacturer : Lockheed Martin Corporation | ||
| NSN Number : 5962-01-370-0389 (5962013700389) | |||
| Item Name : Microcircuit Memory | CAGE Code : 03538 | ||
| NIIN : 013700389 | |||
| FSC CODE : 5962 Microcircuits Electronic | |||
Thank you for taking an interest in part number 1219253-204, that of which is listed with the description Microcircuit Memory; Manufactured by Lockheed Martin Corporation and listed alongside the NSN 5962013700389, part number 1219253-204 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-370-0389 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013700389 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| ROM/PROM | 5 | 1 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AGAV | END ITEM IDENTIFICATION | AN/FPS-124 |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.04 WATTS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | PROGRAMMED AND SCHOTTKY |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | BIPOLAR METAL-OXIDE SEMICONDUCTOR |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,DIGITAL,SCHOTTKY,BIPOLAR 65,536 BIT (8K X 8) PROGRAMMABLE READ-ONLY MEMORY (PROM),MONOLITHIC SILICON |
| TEST | TEST DATA DOCUMENT | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| ZZZK | SPECIFICATION/STANDARD DATA | 67268-82009 GOVERNMENT STANDARD AND 56232-1219253 MANUFACTURERS SPECIFICATION CONTROL |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| ZZZT | NONDEFINITIVE SPEC/STD DATA | 02 TYPE AND J CASE AND A FINISH AND 204 NUMBER |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.3 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY AND 5.5 VOLTS MAXIMUM ABSOLUTE INPUT AND 4.5 VOLTS MINIMUM POSITIVE POWER SUPPLY SPAN AND 5.5 VOLTS MAXIMUM POSITIVE POWER SUPPLY SPAN |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 100.00 MILLIAMPERES MAXIMUM OUTPUT SINK |
| CZEQ | TIME RATING PER CHACTERISTIC | 55.00 NANOSECONDS NOMINAL ACCESS |
| CZER | MEMORY DEVICE TYPE | PROM |
| CZES | HYBRID TECHNOLOGY TYPE | MONOLITHIC |
| ZZZX | DEPARTURE FROM CITED DESIGNATOR | ALTERED BY PROGRAMMING,MARKING & TESTING |
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