Part Number : 9174926 | Manufacturer : Micrometrics Inc | ||
NSN : 5961-00-973-2701 (5961009732701) | |||
Item Name : Semiconductordeviceset | CAGE Code : 0EFF4 | ||
NIIN : 00-973-2701 (009732701) | |||
FSC Code : 5961 Semiconductor Devices and Associated Hardware | |||
FSG Code : 59 Electrical and Electronic Equipment Components | |||
INC Code : 20590 | |||
NCB Code : 00 | Country : USA |
Thank you for taking an interest in part number 9174926, that of which is listed with the description Semiconductordeviceset; Manufactured by Micrometrics Inc and listed alongside the NSN 5961009732701, part number 9174926 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : 9174926 | Manufacturer : Micrometrics Inc | ||
NSN Number : 5961-00-973-2701 (5961009732701) | |||
Item Name : Semiconductordeviceset | CAGE Code : 0EFF4 | ||
NIIN : 009732701 | |||
FSC CODE : 5961 Semiconductor Devices and Associated Hardware |
Thank you for taking an interest in part number 9174926, that of which is listed with the description Semiconductordeviceset; Manufactured by Micrometrics Inc and listed alongside the NSN 5961009732701, part number 9174926 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-973-2701 Item PartTypeName: SEMICONDUCTOR DEVICE SET | 5961 | 009732701 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | G | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
99040571 | C | 2 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABHP | OVERALL LENGTH | 0.800 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.840 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.292 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.296 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | MICROWAVE AND MIXER |
ALAS | INTERNAL CONFIGURATION | POINT CONTACT ALL SEMICONDUCTOR DEVICE DIODE |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
PMLC | PRECIOUS MATERIAL AND LOCATION | METAL PARTS PLATED GOLD |
TEST | TEST DATA DOCUMENT | 18876-9174926 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAW |
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