Part Number : MM-2147J-3 883B | Manufacturer : National Semiconductor Corporation | ||
NSN : 5962-01-143-1733 (5962011431733) | |||
Item Name : Microcircuit Memory | CAGE Code : 27014 | ||
NIIN : 01-143-1733 (011431733) | |||
FSC Code : 5962 Microcircuits Electronic | |||
FSG Code : 59 Electrical and Electronic Equipment Components | |||
NCB Code : 01 | Country : USA | ||
Alternate P/N: MM2147J3883B |
Thank you for taking an interest in part number MM-2147J-3 883B, that of which is listed with the description Microcircuit Memory; Manufactured by National Semiconductor Corporation and listed alongside the NSN 5962011431733, part number MM-2147J-3 883B is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : MM-2147J-3 883B | Manufacturer : National Semiconductor Corporation | ||
NSN Number : 5962-01-143-1733 (5962011431733) | |||
Item Name : Microcircuit Memory | CAGE Code : 27014 | ||
NIIN : 011431733 | |||
FSC CODE : 5962 Microcircuits Electronic |
Thank you for taking an interest in part number MM-2147J-3 883B, that of which is listed with the description Microcircuit Memory; Manufactured by National Semiconductor Corporation and listed alongside the NSN 5962011431733, part number MM-2147J-3 883B is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
MRC | Criteria | Characteristic |
---|---|---|
CZEQ | Time Rating Per Chacteristic | 85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
CZER | Memory Device Type | ROM |
CQZP | Input Circuit Pattern | 15 INPUT |
ADAT | Body Width | 0.265 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
CQSJ | Inclosure Material | CERAMIC |
CWSG | Terminal Surface Treatment | SOLDER |
MRC | Decoded Requirement | Clear Text Reply |
ADAQ | Body Length | 0.880 INCHES MINIMUM AND 0.920 INCHES MAXIMUM |
CBBL | Features Provided | STATIC OPERATION AND HIGH SPEED AND HERMETICALLY SEALED |
AEHX | Maximum Power Dissipation Rating | 1.2 WATTS |
ADAU | Body Height | 0.140 INCHES MINIMUM AND 0.165 INCHES MAXIMUM |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
AFGA | Operating Temp Range | -10.0/+85.0 DEG CELSIUS |
TTQY | Terminal Type And Quantity | 18 PRINTED CIRCUIT |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
CQWX | Output Logic Form | METAL OXIDE-SEMICONDUCTOR LOGIC |
CZEN | Voltage Rating And Type Per Characteristic | 7.0 VOLTS MAXIMUM POWER SOURCE |
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