Part Number : 5031-42 | Manufacturer : Raytheon Company | ||
NSN : 5961-00-945-1957 (5961009451957) | |||
Item Name : Semiconductor Device Test System | CAGE Code : 05869 | ||
NIIN : 00-945-1957 (009451957) | |||
FSC Code : 5961 Semiconductor Devices and Associated Hardware | |||
FSG Code : 59 Electrical and Electronic Equipment Components | |||
INC Code : 77777 | |||
NCB Code : 00 | Country : USA | ||
Alternate P/N: 503142 |
Thank you for taking an interest in part number 5031-42, that of which is listed with the description Semiconductor Device Test System; Manufactured by Raytheon Company and listed alongside the NSN 5961009451957, part number 5031-42 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : 5031-42 | Manufacturer : Raytheon Company | ||
NSN Number : 5961-00-945-1957 (5961009451957) | |||
Item Name : Semiconductor Device Test System | CAGE Code : 05869 | ||
NIIN : 009451957 | |||
FSC CODE : 5961 Semiconductor Devices and Associated Hardware |
Thank you for taking an interest in part number 5031-42, that of which is listed with the description Semiconductor Device Test System; Manufactured by Raytheon Company and listed alongside the NSN 5961009451957, part number 5031-42 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-945-1957 Item PartTypeName: SEMICONDUCTOR DEVICE,TEST SYSTEM | 5961 | 009451957 | N | |||
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | ||||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
209A | C | 1 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
ZZZY | REFERENCE NUMBER DIFFERENTIATING CHARACTERISTICS | SELECTED AND TESTED FOR POLARIS MISSILE SYSTEM |
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