Part Number : 298-2320 | Manufacturer : Tektronix Gmbh | ||
NSN : 6625-01-460-7146 (6625014607146) | |||
Item Name : Test Set Semiconduc | CAGE Code : 80009 | ||
NIIN : 01-460-7146 (014607146) | |||
FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
FSG Code : 66 Instruments and Laboratory Equipment | |||
INC Code : 25006 | |||
NCB Code : 01 | Country : USA | ||
Alternate P/N: 2982320 |
Thank you for taking an interest in part number 298-2320, that of which is listed with the description Test Set Semiconduc; Manufactured by Tektronix Gmbh and listed alongside the NSN 6625014607146, part number 298-2320 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
Part Number : 298-2320 | Manufacturer : Tektronix Gmbh | ||
NSN Number : 6625-01-460-7146 (6625014607146) | |||
Item Name : Test Set Semiconduc | CAGE Code : 80009 | ||
NIIN : 014607146 | |||
FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments |
Thank you for taking an interest in part number 298-2320, that of which is listed with the description Test Set Semiconduc; Manufactured by Tektronix Gmbh and listed alongside the NSN 6625014607146, part number 298-2320 is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
MRC | Criteria | Characteristic |
---|---|---|
ABGL | WIDTH | 11.450 INCHES NOMINAL |
FTLD | III FUNCTIONAL DESCRIPTION | PROVIDES ADVANCED TROUBLESHOOTING CAPABILITIES TO SIMPLIFY TESTING OF CMOS AND MOS CIRCUITS; TROUBLESHOOTS GATE-FIRED SCRS, TRIACS, AND OPTO-COUPLERS |
AQXZ | OPERATING TEST CAPABILITY | TEST FREQUENCY 50 HZ OR 60 HZ, 200 HZ, 2,000 HZ; PULSE GENERATOR 0 V TO5 V |
FAAZ | PHASE | TWO |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
FEAT | SPECIAL FEATURES | BUILT-IN PULSE GENERATOR |
ACYN | AC VOLTAGE RATING | 100.0 VOLTS NOMINAL AND 230.0 VOLTS NOMINAL |
AQXY | TEST TYPE FOR WHICH DESIGNED | CURRENT VOLTAGE ANALOG SIGNATURE |
AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
HGTH | HEIGHT | 2.450 INCHES NOMINAL |
AGAV | III END ITEM IDENTIFICATION | USED WITH TDS210 OR TDS 220 DIGITAL REAL TIME OSCILLOSCOPES |
AEJZ | DEPTH | 10.200 INCHES NOMINAL |
AEAS | MAJOR COMPONENTS | TR210; INSTRUCTION MANUAL; ONE SET ATL25 TEST PROBES; COMMON TEST LEADS; TWO MINI-CLIP LEADS; U.S. POWER CORD |
ACZB | FREQUENCY RATING | 60.0 HERTZ NOMINAL |
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