| Part Number : TS268EU | Manufacturer : Voron Electronics Corp | ||
| NSN : 6625-00-923-6534 (6625009236534) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 94518 | ||
| NIIN : 00-923-6534 (009236534) | |||
| FSC Code : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
| FSG Code : 66 Instruments and Laboratory Equipment | |||
| INC Code : 25006 | |||
| NCB Code : 00 | Country : USA | ||
Thank you for taking an interest in part number TS268EU, that of which is listed with the description Test Set Semiconduc; Manufactured by Voron Electronics Corp and listed alongside the NSN 6625009236534, part number TS268EU is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| Part Number : TS268EU | Manufacturer : Voron Electronics Corp | ||
| NSN Number : 6625-00-923-6534 (6625009236534) | |||
| Item Name : Test Set Semiconduc | CAGE Code : 94518 | ||
| NIIN : 009236534 | |||
| FSC CODE : 6625 Electrical And Electronic Properties Measuring And Testing Instruments | |||
Thank you for taking an interest in part number TS268EU, that of which is listed with the description Test Set Semiconduc; Manufactured by Voron Electronics Corp and listed alongside the NSN 6625009236534, part number TS268EU is available for immediate purchase on our website. As such, to learn more about this offering while receiving a competitive quote for your comparisons, be sure to fill out and submit the RFQ form presented on this page. Within 15 minutes of us receiving and reviewing a completed form, a member of our staff will contact you to present a tailored solution for your comparisons.
| MRC | Criteria | Characteristic |
|---|---|---|
| ABRY | Length | 8.187 INCHES NOMINAL |
| MRC | Decoded Requirement | Clear Text Reply |
| HGTH | Height | 3.625 INCHES NOMINAL |
| AQXZ | Operating Test Capability | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
| ABGL | Width | 6.000 INCHES NOMINAL |
| AQXY | Test Type For Which Designed | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
| ALSF | Internal Battery Accommodation | INCLUDED |
| ANPZ | Inclosure Feature | SINGLE ITEM W/CARRYING CASE |
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